Data sheet acquired from Cypress Semiconductor Corporation.Data sheet modified to remove devices not offered.
CY/74FCT245TSCCS018 - May 1994 - Revised February 2000
8-Bit Transceiver
Functional Description
TheFCT245Tcontainseightnon-invertingbidirectionalbuff-erswiththree-stateoutputsandisintendedforbusorientedapplications.FortheFCT245T,currentsinkingcapabilityismA at the A and B ports.
TheTransmit/Receiver(T/R)inputdeterminesthedirectionofdataflowthroughbidirectionaltransceiver.Transmit(ActiveHIGH)enablesdatafromAportstoBports.Theoutputenable(OE),whenHIGH,disablesboththeAandBportsbyputtingthem in a High Z condition.
Theoutputsaredesignedwithapower-offdisablefeaturetoallow for live insertion of boards.
Features
•Function, pinout, and drive compatible with FCT, andF logic
•FCT-D speed at 3.8 ns max. (Com’l),FCT-C speed at 4.1 ns max. (Com’l),FCT-A speed at 4.6 ns max. (Com’l)
•Reduced VOH (typically = 3.3V) versions of equivalentFCT functions
•Edge-rate control circuitry for significantly improvednoise characteristics•Power-off disable feature•ESD > 2000V
•Matched rise and fall times
•FullycompatiblewithTTLinputandoutputlogiclevels•Extended commercial range of−40˚C to +85˚C•Sink current mA (Com’l), 48 mA (Mil)Source current32 mA (Com’l), 12 mA (Mil)
LogicBlockDiagramT/ROEA0B0A1B1A2B2A3B3A4B4A5B5A6B6A7B7PinConfigurationsLCCTop ViewA6A5A4A3A2DIP/SOIC/QSOPTop ViewT/RA0A13212019A1A0T/RVCCOEA2A3A4A5A6A7GND12345671020191817161514131211VCCOEB0B1B2B3B4B5B6B7A7GNDB7B6B510111213761415161718B4B3B2B1B0Function Table[1]
OELLHT/RLHXOperationB Data to Bus AA Data to Bus BHigh Z StateNote:1.H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.Copyright © 2000, Texas Instruments Incorporated
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CY/74FCT245TMaximum Ratings[2,3]
(Abovewhichtheusefullifemaybeimpaired.Foruserguidelines, not tested.)
Storage Temperature.....................................−65°C to +150°CAmbient Temperature with
Power Applied..................................................−65°C to +135°CSupply Voltage to Ground Potential..................−0.5V to +7.0VDC Input Voltage.................................................−0.5V to +7.0VDC Output Voltage..............................................−0.5V to +7.0VDC Output Current (Maximum Sink Current/Pin).......120 mA
Power Dissipation..........................................................0.5WStatic Discharge Voltage............................................>2001V(per MIL-STD-883, Method 3015)
Operating Range
RangeCommercialCommercialMilitary[4]RangeDTT, AT, CTAllAmbientTemperature0°C to +70°C−40°C to +85°C−55°C to +125°CVCC5V± 5%5V± 5%5V± 10%Electrical CharacteristicsOver the Operating Range
ParameterVOHDescriptionOutput HIGH VoltageTest ConditionsVCC=Min., IOH=−32 mAVCC=Min., IOH=−15 mAVCC=Min., IOH=−12 mAVOLVIHVILVHVIKIIIIHIILIOSIOFFOutput LOW VoltageInput HIGH VoltageInput LOW VoltageHysteresis[6]Input Clamp Diode VoltageInput HIGH CurrentInput HIGH CurrentInput LOW CurrentOutput Short Circuit Current[7]Power-Off DisableAll inputsVCC=Min., IIN=−18 mAVCC=Max., VIN=VCCVCC=Max., VIN=2.7VVCC=Max., VIN=0.5VVCC=Max., VOUT=0.0VVCC=0V, VOUT=4.5V−60−1200.2−0.7−1.25±1±1−225±1VCC=Min., IOL= mAVCC=Min., IOL=48mACom’lCom’lMilCom’lMil2.00.8Min.2.02.42.43.33.30.30.30.550.55Typ.[5]Max.UnitVVVVVVVVVµAµAµAmAµACapacitance[6]
ParameterCINCOUTInput CapacitanceOutput CapacitanceDescriptionTyp.[5]59Max.1012UnitpFpFNotes:2.Unless otherwise noted, these limits are over the operating free-air temperature range.3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.4.TA is the “instant on” case temperature.5.Typical values are at VCC=5.0V, TA=+25˚C ambient.6.This parameter is specified but not tested.7.Notmorethanoneoutputshouldbeshortedatatime.Durationofshortshouldnotexceedonesecond.Theuseofhigh-speedtestapparatusand/orsampleandholdtechniquesarepreferableinordertominimizeinternalchipheatingandmoreaccuratelyreflectoperationalvalues.Otherwiseprolongedshortingofahighoutputmayraisethechiptemperaturewellabovenormalandtherebycauseinvalidreadingsinotherparametrictests.Inanysequenceofparametertests, IOS tests should be performed last.2
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CY/74FCT245TPower Supply Characteristics
ParameterICC∆ICCICCDDescriptionQuiescent Power Supply CurrentQuiescent Power Supply Current(TTL inputs HIGH)Dynamic Power Supply Current[9]Test ConditionsVCC=Max., VIN≤0.2V, VIN≥VCC−0.2VVCC=Max., VIN=3.4V,[8]f1=0, Outputs OpenVCC=Max., One Input Toggling,50% Duty Cycle, Outputs Open,T/R orOE=GND andVIN≤0.2V or VIN≥VCC−0.2VVCC=Max.,50%DutyCycle,OutputsOpen,One Bit Toggling at f1=10 MHz,T/R orOE=GND andVIN≤0.2V or VIN≥VCC−0.2VVCC=Max.,50%DutyCycle,OutputsOpen,One Bit Toggling at f1=10 MHz,T/RorOE=GNDandVIN=3.4VorVIN=GNDVCC=Max.,50%DutyCycle,OutputsOpen,Eight Bits Toggling at f1=2.5 MHz,T/R orOE=GND andVIN≤0.2V or VIN≥VCC−0.2VVCC=Max.,50%DutyCycle,OutputsOpen,Eight Bits Toggling at f1=2.5 MHz,T/RorOE=GNDandVIN=3.4VorVIN=GNDNotes:8.Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.9.This parameter is not directly testable, but is derived for use in Total Power Supply calculations.=IQUIESCENT + IINPUTS+ IDYNAMIC10.ICIC=ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)ICC=Quiescent Current with CMOS input levels∆ICC=Power Supply Current for a TTL HIGH input (VIN=3.4V)DH=Duty Cycle for TTL inputs HIGHNT=Number of TTL inputs at DHICCD=Dynamic Current caused by an input transition pair (HLH or LHL)=Clock frequency for registered devices, otherwise zerof0=Input signal frequencyf1=Number of inputs changing at f1N1All currents are in milliamps and all frequencies are in megahertz.11.Values for these conditions are examples of the ICC formula. These limits are specified but not tested.Typ.[5]0.10.50.06Max.0.22.00.12UnitmAmAmA/MHzICTotal Power Supply Current[10]0.71.4mA1.23.4mA1.32.6[11]mA3.310.6[11]mA3
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CY/74FCT245TSwitching CharacteristicsOver the Operating Range
FCT245TMilitaryParametertPLHtPHLtPZHtPZLtPHZtPLZDescriptionPropagation DelayA to B or Bto AOutput Enable TimeOE or T/R to A or BOutput Disable TimeOE or T/R to A or BMin.[12]1.51.51.5Max.7.510.010.0CommercialMin.[12]1.51.51.5Max.7.09.57.5Min.[12]1.51.51.5FCT245ATMilitaryMax.4.96.56.0CommercialMin.[12]1.51.51.5Max.4.66.25.0UnitnsnsnsFig.No.[13]1, 31, 7, 81, 7, 8Switching CharacteristicsOver the Operating Range (continued)
FCT245CTMilitaryParametertPLHtPHLtPZHtPZLtPHZtPLZDescriptionPropagation DelayA to B or Bto AOutput Enable TimeOE or T/R to A or BOutput Disable TimeOE or T/R to A or BMin.[12]1.51.51.5Max.4.56.25.2CommercialMin.[12]1.51.51.5Max.4.15.84.8FCT245DTCommercialMin.[12]1.51.51.5Max.3.85.04.3UnitnsnsnsFig.No.[13]1, 31, 7, 81, 7, 8Ordering Information
Speed(ns)3.84.14..6Ordering CodeCY74FCT245DTQCTCY74FCT245DTSOC/SOCTCY74FCT245CTQCTCY74FCT245CTSOC/SOCTCYFCT245CTDMBCYFCT245CTLMBCY74FCT245ATPCCY74FCT245ATQCTCY74FCT245ATSOC/SOCT4.97.07.5CYFCT245ATDMBCYFCT245ATLMBCY74FCT245TQCTCY74FCT245TSOC/SOCTCYFCT245TDMBCYFCT245TLMBPackageNameQ5S5Q5S5D6L61P5Q5S5D6L61Q5S5D6L61Package Type20-Lead (150-Mil) QSOP20-Lead (300-Mil) Molded SOIC20-Lead (150-Mil) QSOP20-Lead (300-Mil) Molded SOIC20-Lead (300-Mil) CerDIP20-Square Leadless Chip Carrier20-Lead (300-Mil) Molded DIP20-Lead (150-Mil) QSOP20-Lead (300-Mil) Molded SOIC20-Lead (300-Mil) CerDIP20-Square Leadless Chip Carrier20-Lead (150-Mil) QSOP20-Lead (300-Mil) Molded SOIC20-Lead (300-Mil) CerDIP20-Square Leadless Chip CarrierMilitaryCommercialMilitaryCommercialMilitaryCommercialOperatingRangeCommercialNotes:12.Minimum limits are specified but not tested on Propagation Delays.13.See “Parameter Measurement Information” in the General Information section.Document #: 38−00318−B
4
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CY/74FCT245TPackage Diagrams
20-Lead(300-Mil)CerDIPD620-PinSquareLeadlessChipCarrierL61MIL−STD−1835D−8 Config.AMIL−STD−1835 C−2A20-Lead(300-Mil)MoldedDIPP55
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CY/74FCT245T
Package Diagrams (continued)
20-LeadQuarterSizeOutlineQ520-Lead(300-Mil)MoldedSOICS56
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