专利名称：METHOD AND DEVICE FOR TESTING
PROFILED GROOVES
发明人：KNOCHE, WOLFRAM,KOENIG, NIELS申请号：EP10759831.0申请日：20100906公开号：EP2475846A1公开日：20120718
摘要：The invention relates to a method for testing profiled grooves comprising atleast one pair of support surfaces using a test specimen that has a plurality of measuringsurfaces and a cross-sectional shape that is adapted to the geometry of the groove to betested, wherein distance sensors are arranged in the measuring surfaces in at least twomeasuring planes parallel to the cross-sectional plane of the test specimen such that, in afirst measuring plane, at least two distance sensors are provided in each measuringsurface and, in a second measuring plane, at least one sensor each is provided in ameasuring surface opposite of the groove base and in a further measuring surface in aprofile longitudinal direction on a line with a sensor in the first measuring plane,
respectively, comprises the following steps: positioning the test specimen in the groove;placing the test specimen against at least one of the support surfaces of the groove andfixing the test specimen in the groove by maintaining a predefined pressing force;activating the sensors and receiving signals from the same; calculating a distance valuefor each sensor on the basis of the sensor signals; calculating a distance deviation valuefor each distance sensor with respect to a previously stored reference cross-section ofthe groove; calculating positional deviations of the test specimen with respect to the
groove on the basis of the distance deviation values for the distance sensors in the firstand second measuring planes, under the assumption that the groove geometry betweenthe first and second groove planes does not substantially change; calculating thecorrected distance deviation values for the distance sensors of the first measuring planeby compensating for the calculated positional deviations; and calculating an actualgeometry of the groove on the basis of the compensated distance deviation values forthe distance sensors of the first measuring plane.
申请人：SIEMENS AKTIENGESELLSCHAFT
地址：Wittelsbacherplatz 2 80333 Munich DE
国籍：DE
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