专利名称：Electrical testing apparatus发明人：Day, Clive Richard申请号：EP91202975.8申请日：19911115公开号：EP0486114A2公开日：19920520
专利附图：
摘要：The present invention provides an apparatus (1) for testing an electrical circuitfor leakage and continuity losses. It comprises a voltage supply (VHT), a monitor circuit,having a first and second half, a current supply means (2) for supplying an input current(IS, IO) of equal magnitude to each half of the monitor circuit, connection means for
connecting a circuit to be tested (3) to the first half of the monitor circuit and currentvarying means (2). The current varying means (2) is operable to vary the input currents (IS,IO) so as to maintain an output current (IR) from the circuit to be tested constantirrespective of any leakage losses (IL) in the circuit to be tested and to increase thecurrent (IO) in the second half in proportion to the magnitude of the leakage loss ((IL).First connection means are provided for connecting a first voltage measuring meansacross the two halves thereby to determine the magnitude of the leakage loss (IL).
申请人：BRITISH AEROSPACE PUBLIC LIMITED COMPANY
地址：Warwick House, P.O. Box 87, Farnborough Aerospace Centre Farnborough,Hants. GU14 6YU GB
国籍：GB
代理机构：Rooney, Paul Blaise
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