X-ray source and detector configuration for a non-

专利名称：X-ray source and detector configuration for

a non-translational x-ray diffraction system

发明人：Peter Michael Edic,Geoffrey Harding,Bruno

K. B. De Man,Helmut Rudolf Strecker

申请号：US122071申请日：20080910公开号：US07742563B2公开日：20100622

专利附图：

摘要：A system and method for scanning objects using a non-translational x-raydiffraction (XRD) system is disclosed. The system includes a scanning area through which

an object to be scanned traverses and a distributed x-ray source having a plurality offocal spot locations. The distributed x-ray source is affixed on the scanning area and isconfigured to emit x-rays towards the object as a series of parallel x-ray beams. Astationary detector arrangement is affixed on another side of the scanning area generallyopposite the distributed x-ray source and is configured to measure a coherent scatterspectra of the x-rays after passing through the object. A data acquisition system (DAS) isconnected to the detector arrangement and is configured to measure the coherentscatter spectra, which is utilized to generate XRD data and determine a materialcomposition of at least a portion of the object from the XRD data.

申请人：Peter Michael Edic,Geoffrey Harding,Bruno K. B. De Man,Helmut RudolfStrecker

地址：Albany NY US,Hamburg DE,Clifton Park NY US,Hamburg DE

国籍：US,DE,US,DE

代理机构：Armstrong Teasdale LLP

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