专利名称：IMPROVEMENTS IN OR RELATING TO
PROBE CARDS
发明人：WOOD, David, c/o University of
Durham,COOKE, Michael, c/o University ofDurham
申请号：EP05758612.5申请日：20050608公开号：EP1754068A1公开日：20070221
摘要：A probe card for testing IC circuits is provided that comprises a probe memberfor each IC contact that comprises a flexible membrane structure secured at two pointsto a reverse surface of a substrate. A contact means can also be provided, which can be aprobe bump or a specially shaped recess. Force limiting means can be provided so thatthe force applied can be controlled and damage of the IC to be tested can be limited.
申请人：UNIVERSITY OF DURHAM
地址：Old Shire Hall, Old Elvet Durham, DH1 3HP GB
国籍：GB
代理机构：McBride, Peter Hill
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容