Method and system for near-field spectroscopy usin

专利名称：Method and system for near-field

spectroscopy using targeted deposition ofnanoparticles

发明人：Mark S. Anderson申请号：US12324693申请日：20081126公开号：US081043B2公开日：20120131

专利附图：

摘要：There is provided in one embodiment of the invention a method for analyzing asample material using surface enhanced spectroscopy. The method comprises the stepsof imaging the sample material with an atomic force microscope (AFM) to select an areaof interest for analysis, depositing nanoparticles onto the area of interest with an AFMtip, illuminating the deposited nanoparticles with a spectrometer excitation beam, anddisengaging the AFM tip and acquiring a localized surface enhanced spectrum. The

method may further comprise the step of using the AFM tip to modulate the

spectrometer excitation beam above the deposited nanoparticles to obtain improvedsensitivity data and higher spatial resolution data from the sample material. The inventionfurther comprises in one embodiment a system for analyzing a sample material usingsurface enhanced spectroscopy.

申请人：Mark S. Anderson

地址：La Crescenta CA US

国籍：US

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