Apparatus for measuring wavefront aberrations

专利名称：Apparatus for measuring wavefront

aberrations

发明人：Davis, Brett A.,Collins, Michael J.,Iskander,

Daoud R.,Roffman, Jeffrey H.,Ross III,Denwood F.

申请号：EP06076671.4申请日：20010921公开号：EP1745738A3公开日：20070829

专利附图：

摘要：An apparatus and method for measuring wavefront aberrations. The apparatus

comprises a reflecting device (128) for reflecting selected portions of the wavefront(126), an imaging device (132) for capturing information related to the selected portions,and a processor (136) for calculating aberrations of the wavefront from the capturedinformation. The method comprises reflecting selected portions of a wavefront (126)onto the imaging device (132), capturing information related to the selected portions,and processing the captured information to derive the aberrations.

申请人：Johnson and Johnson Vision Care, Inc.

地址：7500 Centurion Parkway, Suite 100 Jacksonville, FL 32256 US

国籍：US

代理机构：Fisher, Adrian John

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