您好,欢迎来到意榕旅游网。
搜索
您的当前位置:首页APPARATUS FOR DETECTING DEFECTS, PARTICULARLY IN C

APPARATUS FOR DETECTING DEFECTS, PARTICULARLY IN C

来源:意榕旅游网
专利内容由知识产权出版社提供

专利名称:APPARATUS FOR DETECTING DEFECTS,

PARTICULARLY IN CASTINGS

发明人:JACOB, Michel申请号:EP87900175.0申请日:19861226公开号:EP0253829A1公开日:19880127

摘要: A plurality of sensor exciter couples (EA1 M1) and (M2 EA2) are disposed nearthe workpiece (1) to be tested. A circuit (2) for generating, measuring and processing formeasuring the resonant frequencies of various modes and interpreted to derive thedesired characteristics.

申请人:JACOB, Michel

地址:15, rue du Sel F-56700 Hennebont FR

国籍:FR

代理机构:Dubreuil, Annie

更多信息请下载全文后查看

因篇幅问题不能全部显示,请点此查看更多更全内容

Copyright © 2019- yrrf.cn 版权所有

违法及侵权请联系:TEL:199 1889 7713 E-MAIL:2724546146@qq.com

本站由北京市万商天勤律师事务所王兴未律师提供法律服务