专利名称：APPARATUS FOR DETECTING DEFECT OF
WORK
发明人：Hiroshi Aono申请号：US14006435申请日：20110323
公开号：US20140015961A1公开日：20140116
专利附图：
摘要：A defect detecting apparatus detects a defect that is present on the outercircumferential surface of work having the outer circumferential surface thereof formedas a bent surface. The defect detecting apparatus is provided with: a jig which supports
the work, and holds the work in a state wherein the work is rotated by a predeterminedangle; an image pickup device, which picks up an image of the outer circumferentialsurface of the work held by the jig, the work being in the state wherein the work isrotated by the predetermined angle; and a controller, which processes an imageobtained by means of the image pickup device, and determines a defect. The controllerstores information relating to the shape of the outer circumferential surface of the work,and information relating to the positional relationship, at each rotation angle, betweenthe image pickup device and a work area having the image thereof picked up by theimage pickup device, and the control apparatus uses the information at the time ofdetermining the defect.
申请人：Hiroshi Aono
地址：Miyoshi-shi JP
国籍：JP
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