Apparatus and method for observing sample

专利名称：Apparatus and method for observing

sample

发明人：見澤 謙佑,坂本 広明,坂本 明洋申请号：JP2018229252申请日：20181206公开号：JP2019101045A公开日：20190624

专利附图：

摘要：Problem to be solved: in situ observation of the process of the phasetransformation of the sample to the cooling medium in the state of the melt withoutbreaking the cooling medium. The sample observation apparatus 1 comprises a dischargeportion 10 for discharging the molten sample 2 and a contact surface S1 contacting thesample 2 discharged from the discharge part 10, and a cooling medium comprising acompound semiconductor for cooling the sample 2 contacting the contact surface The

body 21 includes an imaging portion 30 emitted from a sample 2 which is in contact withthe contact surface S1 and for imaging the radiation light L1 transmitted through thecooling medium 21. Diagram

申请人：日本製鉄株式会社

地址：東京都千代田区丸の内二丁目６番１号

国籍：JP

代理人：特許業務法人太陽国際特許事務所

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