Measuring probe for measuring high frequencies

专利名称：Measuring probe for measuring high

frequencies

发明人：Michael Wollitzer申请号：US10088591申请日：20000918公开号：US07042236B1公开日：20060509

专利附图：

摘要：The invention relates to a measuring probe () for measuring high frequencies,comprising a contact end () for contacting planar structures and a coaxial-cable end () forconnecting to a coaxial cable (), whereby a coplanar conductor structure () consisting of at

least two conductors () is located between the contact end () and the coaxial-cable end ().A dielectric () which supports the coplanar conductor structure () is provided on at leastone side, in particular both sides of the coplanar conductor structure () which extendsover a predetermined section between the coaxial-cable end () and the contact end ().Between the dielectric () and the contact end (), the measuring probe () is configured insuch a way, that the conductors () of the coplanar conductor structure () are held freely inspace and are mounted in an elastic manner in relation to the supporting dielectric ().

申请人：Michael Wollitzer

地址：Fridolfing DE

国籍：DE

代理机构：Lowe, Hauptman & Berner, LLP

更多信息请下载全文后查看