专利名称：CLASSIFYING SYSTEM AND FINE PARTICLE
MEASURING DEVICE
发明人：OKUDA, Daiji,OKUDA, Hiroshi,INOUE, Fujio申请号：EP06843052.9申请日：20061222公开号：EP1965191A1公开日：20080903
专利附图：
摘要：A classification apparatus for classifying and separating particles having particlesizes within a predetermined range is disclosed. In a preferred embodiment of theclassification apparatus, a center electrode (3) and an outside electrode (4) generate an
electric field for classifying charged fine particles according to electric mobility. In theupper part of a housing (1), a sheath gas supply portion (7) is provided. An aerosol supplyportion (11) has an introduction port (11 a) provided on the outside electrode (4) side in aclassification region (5), and supplies a charged aerosol at a constant flow rate throughthe introduction port (11a). On the downstream side in the flow of a sheath gas in theclassification region (5), a larger-size particle discharge portion (13) is provided. Thelarger-size particle discharge portion (13) has a discharge port (13a) provided on theoutside electrode (4) side, and discharges charged fine particles, which are contained inthe classified charged aerosol and have particle sizes larger than a predeterminedparticle size, together with part of the sheath gas at a constant flow rate. A detector (18)is provided downstream of the housing (1) to detect the number of remaining chargedfine particles contained in the sheath gas introduced thereinto as the quantity ofelectricity.
申请人：Shimadzu Corporation
地址：1, Nishinokyo-Kuwabaracho, Nakagyo-ku Kyoto-shi, Kyoto 604-8511 JP
国籍：JP
代理机构：Schoppe, Fritz
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