Power supply apparatus for test apparatus

专利名称：Power supply apparatus for test apparatus发明人：Takahiko Shimizu,Katsuhiko Degawa申请号：US13402502申请日：20120222公开号：US09188633B2公开日：20151117

专利附图：

摘要：A first A/D converter converts an analog observed value, which corresponds toa power supply signal supplied to a power supply terminal of a DUT, into a digitalobserved value. By means of digital calculation processing, a digital signal processingcircuit generates a control value that is adjusted such that the digital observed value

matches a predetermined reference value. A first D/A converter supplies, via a powersupply line to the power supply terminal of the DUT, an analog power supply signalobtained by performing digital/analog conversion of the control value. A load estimatingunit applies a test signal containing a predetermined frequency component via the powersupply line to a node via which the power supply terminal is to be connected, andgenerates a control parameter for the digital signal processing circuit according to thetest signal and the observed signal.

申请人：Takahiko Shimizu,Katsuhiko Degawa

地址：Tokyo JP,Tokyo JP

国籍：JP,JP

代理机构：Cantor Colburn LLP

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