Method for measuring light intensity distribution

专利名称：Method for measuring light intensity

distribution

发明人：Jun Zhu,Jing-Lei Zhu,Kai-Li Jiang,Chen

Feng,Ji-Qing Wei,Guo-Fan Jin,Shou-Shan Fan

申请号：US13729300申请日：20121228公开号：US08830453B2公开日：20140909

专利附图：

摘要：A method for measuring intensity distribution of light includes a step ofproviding a carbon nanotube array located on a surface of a substrate. The carbon

nanotube array has a top surface away from the substrate. The carbon nanotube arraywith the substrate is located in an inertia environment or a vacuum environment. A lightsource irradiates the top surface of the carbon nanotube array, to make the carbonnanotube array radiate a visible light. A reflector is provided, and the visible light isreflected by the reflector. An imaging element images the visible light reflected by thereflector, to obtain an intensity distribution of the light source.

申请人：Jun Zhu,Jing-Lei Zhu,Kai-Li Jiang,Chen Feng,Ji-Qing Wei,Guo-Fan Jin,Shou-ShanFan

地址：Beijing CN,Beijing CN,Beijing CN,Beijing CN,Beijing CN,Beijing CN,Beijing CN

国籍：CN,CN,CN,CN,CN,CN,CN

代理机构：Novak Druce Connolly Bove + Quigg LLP

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