专利名称：Method of adjusting characteristics of
electronic part
发明人：Takahiro Okada,Jinsei Ishihara,Hideyuki Kato申请号：US09903480申请日：20010711
公开号：US20020022948A1公开日：20020221
专利附图：
摘要：A method of adjusting characteristics of an electronic part such as a dielectricfilter. Values of predetermined characteristics of the electronic part are measured. Anelectromagnetic field simulation is performed to determine characteristic values of the
electronic part which would be obtained when a plurality of structural parameters,corresponding to dimensions of selected portions of the electronic part are varied.Amounts of variations of the parameter values from the design parameter values whichhave to be made to make the difference between the measured characteristic values andthe design characteristic values fall within a predetermined range of allowable error aredetermined based on the results of the simulation. The selected portions of the
electronic part corresponding to the structural parameters are adjusted by the amountsof variations.
申请人：MURATA MANUFACTURING CO., LTD.
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