Droplet discharge inspection apparatus and method

专利名称：Droplet discharge inspection apparatus and

method

发明人：Toshimasa Mori申请号：US11146141申请日：20050607

公开号：US20060001692A1公开日：20060105

专利附图：

摘要：An inspection apparatus includes an inspection body that has a non-conductivesubstrate, a droplet receiving portion for receiving a droplet that is provided on thesubstrate, and a plurality of electrodes that are exposed on an inner surface portion of

the droplet receiving portion. The droplet receiving portion has a size that correspondsto a droplet size in a state when a discharged droplet impacts normally. The inspectionapparatus also includes a detector that is connected to the electrodes of the inspectionbody and detects a conductivity in the droplet receiving portion. The inspectionapparatus makes it possible to inspect easily and in a short time period the dischargeperformance of a droplet discharge head of a droplet discharge apparatus. A dropletdischarge inspection method is also provided.

申请人：Toshimasa Mori

地址：Suwa-gun JP

国籍：JP

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